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Results 1 - 11 of about 11
No. Item Model Manufacture Vintage PDF Contact
GL2712  SEM  S-570  HITACHI   
GL2713  X-ray Analysis  JED-2140  JEOL   
HB0215  Thickness measuring instrument  Nanospec  Nanometrics  1992 
IF0204  FluorescenceXrayAnalyzer  System3630  RIGAKU  1995 
000167  Ellipsometer  FE-VIID  RUDOLPH  1997 
HB0230  Eripso Type Thickness Meter    RUDOLPH  1992 
E00263  Auto Prober  19S  TEL  1992 
GJ0801  Prober  19S  TEL   
GJ0804  Prober  19S  TEL   
DB1201  Auto Prober  APM88A  Tokyo Seimitsu  1992 
000171  Prober  APM90A  TSK  1997 
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