HOME CHINESE JAPANESE KOREAN

Used Equipment Info

HOME > Used equipment infomation > Selling Infomation

Selling Information Procurement Information
search Use of search
Category Manufacture Keyword
Used equipment search result
Results 1 - 24 of about 24
No. Item Model Manufacture Vintage PDF Contact
101015-A32002  Microscope  ARM-5567-2  Arm System  2004 
A0200-007  Die Bonder  CPS-400F  CANON Machinery  2001 
91022-BT2005M  Wafer Inspection System  LEICA IMN100 020-657-101-000 DWL-200  Daitron   
91022-BT2006M  Wafer Inspection System  LEICA IMN100 020-657-101-000 DWL-200  Daitron   
100408-CB0212  TRINOCULAR MICROSCOPE   OPTIPHOT150  Nikon   
100207-026  測長機  LM-43T  Nikon   
91022-BT1063M  Micro-scope with auto-loader    Nikon/Nidec   
100408-CB0543  INSPECTION MICROSCOPE  BH3-MJLA2  OLYMPUS   
100408-CB0216  INSPECTION MICROSCOPE  BHSM  OLYMPUS   
90218-JC1104  Microscope  VANOXAHMT3  OLYMPUS   
3921-S00001  Stereo Microsope  SF1060  OLYMPUS   
3921-S00011  Stereo Microsope  SF1060  OLYMPUS   
91001-BV37003M  Stereo Microsope  SZ4045CHI  OLYMPUS   
91001-BV62863M  Stereo Microsope  SZ4045CHI  OLYMPUS   
91001-BV62864M  Stereo Microsope  SZ4045CHI  OLYMPUS   
91001-BV62937M  Stereo Microsope  SZ4045CHI  OLYMPUS   
91022-BT1071M  Wafer Back-side inspection  OPTIPHOT-200 AL110-LMB8  OLYMPUS   
91022-BT1069M  Wafer Inspection System  AL100N-LMB8  OLYMPUS   
120204-M-043  Metrology Optical microscope  VLM2800  SMS  9604 
120204-M-044  Metrology Optical microscope  VLM2800  SMS  1996 
120204-M-045  Metrology Optical microscope  VLM2800  SMS  1996 
120204-M-046  Metrology Optical microscope  VLM2800  SMS  1996 
A0200-006  High-precision non-contact depth measuring microscope  ハイソメットⅡ DH2  Union   
A0200-008  High-precision non-contact depth measuring microscope  ハイソメット  UNION   
Used equipment infomation TOP