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半導体設備関連 > その他装置 > その他の検索結果

Showing 9 of1 - 9 hits

Control No. Product Name Model Manufacturer Year Details Contact
170607-003 Film thickness AutoEL-Ⅳ RUDOLPH

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170607-009 Particle Detector VM-8000J DNS

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170607-004 Particle Detector Alpha step-200 KLA Tencor

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141006-RM1-247 Ellipsometer FE-IVD Rudolph 1994

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A0388-2 Draft Chamber DFB10-AA15-AA0T Dalton Corporation 2016

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190403-001 Film thickness measurement JVX5200 Jordan Valley

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190403-002 Profiler P-20H KLA-Tencor

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190403-003 AFM X3D 340 Veeco 2004

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190403-004 Macro Inspection Viper 2410 KLA-Tencor 2001

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Showing 9 of1 - 9 hits

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