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半導体設備関連 > その他装置 > その他の検索結果

Showing 15 of1 - 15 hits

Control No. Product Name Model Manufacturer Year Details Contact
181223-001 Particle inspection WM-7S Topcon 2011

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170607-M0009 Particle Detector VM-8000J DNS

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170607-M0004 Particle Detector Alpha step-200 KLA Tencor

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A0388-2 Draft Chamber DFB10-AA15-AA0T Dalton Corporation 2016

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190612-011 Film thickness measurement JVX5200T Jordan Valley

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190612-006 Profiler P-20H KLA-Tencor

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190612-003 Macro Inspection Viper 2410 KLA-Tencor 2001

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190612-008 Film thickness Ramda Ace DNS

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190612-009 C-V mearement CV-8000-L DNS

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190112-2-12-2 SMIF Loader LPT2200 Asyst 2000

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201909-002 X-ray fluorescence analyzer 3700 Rigaku 2000

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201909-003 FIB-SEM S-3000FBN Hitachi

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201909-004 CD-SEM S-7800H Hitachi

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180512-002 Pattern defect KLA2132 KLA

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201909-007 Bond Tester Dage 4000 Dage

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Showing 15 of1 - 15 hits

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